Challenges For Use Of Statistical Software Tools In The Semiconductor Industry

نویسنده

  • Richard Kittler
چکیده

This paper surveys statistical methodologies and associated software tools in use within semiconductor manufacturing to support process characterization, process control, and yield improvement. Current difficulties and challenges are discussed as well as emerging trends that will require the development of new methods and the software to support them.

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تاریخ انتشار 2000